Paper Infomation
ESD Protection Design and Characteristic Analysis of Advanced Process Integrated Circuit
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Author: Mao Fan
Abstract: The electrostatic discharge (ESD) phenomenon is very common, in daily life, many places will appear ESD phenomenon. However, ESD is a potential hazard for integrated circuits. This paper analyzes the ESD protection design and characteristics of advanced process integrated circuits, and puts forward personal views combined with experience, hoping to bring help to the people who pay attention to the ESD protection of integrated circuits.
Keywords: Electrostatic Protection, Integrated Circuit, Failure Analysis
References:
[1] Luo Yuwen, Zhang Jingya. Discussion on Key Technologies of ESD protection for integrated circuits [J]. Equipment management and maintenance, 2019 (22): 140-141
[2] Meng Xiangyu, Zhang Yuekui, Jiang Zhu. Analysis of key technologies for ESD protection of integrated circuits [J]. Electronic testing, 2019 (11): 109-110