Reliability Function of Non-independent Random Variables Subject to Two-Dimensional Standard Normal Distribution

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Scientific Journal of Information Engineering

Scientific Journal of Information Engineering (SJIE) is an international open access journal, concerning about the latest research results of information engineering. The goal of the journal is to provide a global forum for scholars and researchers in this field to exchange ideas and promote the development of theories, applications and technologies in all areas of information engineering.The journal receives manuscripts written in Ch... [More] Scientific Journal of Information Engineering (SJIE) is an international open access journal, concerning about the latest research results of information engineering. The goal of the journal is to provide a global forum for scholars and researchers in this field to exchange ideas and promote the development of theories, applications and technologies in all areas of information engineering.

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Paper Infomation

Reliability Function of Non-independent Random Variables Subject to Two-Dimensional Standard Normal Distribution

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Author: Yangjing Chong, Xinhui Zhou, Yutong Zhu, Hailing Lan, Yunfei Guo

Abstract: In this paper, the joint reliability function of and the reliability function of have been provided in the case of according to the knowledge of the two-dimensional standard normal distribution and the reliability function. Then we make a case analysis and further show the feasibility of reliability function.

Keywords: Two-dimensional standard normal distribution; Non-independent; Reliability function

References:

[1] Yunfei Guo, Research on linear combination distribution of non-independent random variables [D]. Yanbian university,2010.

[2] Xizhao Wang, Probability theory and mathematical statistics, Beijing: Science Press,2009

[3] Kan Cheng, Jinhua Cao, An introduction to mathematics of reliability, Beijing: Higher Education Press,2006

[4] Bonian Wang, Hongguang Wang, Study on error function calculation method [J]. Journal of University of Shanghai for Science and Technology, 2004, (06):529-532.